Digital Microscopes
DSX2000

Powerful Analysis, Dynamic Imaging, Advance measurement

Powerful Analysis, Dynamic Imaging

Combines ease of use with advanced features to streamline your inspection workflow

  • Large selection of lenses that are easy to change
  • Switch between 7 different observation methods by pushing a button
  • Fast macro to micro viewing
  • Accurate measurements with a telecentric optical system
  • Advanced measurements are fast and easy to obtain

Find the Best Image, Fast

Multiple Observations with a Single Click


Speed combined with guaranteed accuracy and repeatability make the DSX2000 digital microscope the right tool for fast failure analysis.


The best image function reviews all available observation methods for your sample and identifies the best imaging mode for revealing what needs to be seen—all with a simple click.

Simplify Operations with an All-in-One Solution

The DSX2000 microscope offers Seven different observation methods at the click of a button. Find optimal viewing conditions using brightfield, darkfield, MIX (darkfield + brightfield), polarization, oblique, differential interference contrast, or our unique shaded relief method.

Brightfield
Shaded Relief
Darkfield
Oblique
Nomarski
Mix
Polarization
Full focus with a single click

A high-precision 3D image with full focus can be obtained with a single click
It is also possible to perform 3D measurements of height, roughness, and other features

See What Matters with One Click

Shaded Relief Observation Mode Reveal ultra-fine, hard-to-see defects in real time, without post-processing delays. Move the stage and scan your sample seamlessly, viewing shaded relief images instantly for fast, thorough inspections.

Image: Brightfield vs Shaded Relief

Fast Macro to Micro Imaging

Macro to Micro Versatility 

The DSX2000 digital microscope offers a wide magnification range of 26X–7,300X using optical zoom, enabling you to complete macro and micro inspections with one system. By providing reliable results easily, the system frees up valuable time to focus on the work that matters most.

Get inspection results with minimal training or quick, accurate answers to your research questions.

    Improve Productivity with Smart Tools

    Do it your way, designed for user in mind.

    A floating panel can be defined with only the commands that matters. 

    EZ mode simplifies the interface by displaying only essential functions. 

    Supervisors can create custom workflows for operators, limiting available buttons for consistency and ease of use.

    The Power To Work Smarter

    EZ MODE : Customized Workflows for Faster Operation

    Arrange your workflow

    Customized workflows and AI capabilities on the DSX2000 digital microscope give you the power to work smarter, unlocking more efficient ways to perform routine inspections or conduct complex analyses.

    Define your Icons

    Define commands that matters to your workflow

    Activate the work flow

    Defined workflow enable users to get to work quickly showing icons of interest

    Unlock Efficiency with Live AI

    This powerful tool instantly reveals hidden details and highlights key features on live images without the need for additional processing.

    Live Image

    Live image of a PCB

    Train the neural network

    PRECiV™ image analysis software equips all Evident industrial microscopes—including the DSX2000 system—with our unique Live AI.

    Apply Neural network to Live image

    AI-assisted decision-making frees your experts from the need to double-check images.

    Automatic Object Improvement
    Eliminates unimportant scratches or elements that could obscure critical information or lead to false detection

    Image (top) : Steel microstructure 
    Image (bottom) : Steel microstructure after live contrast enhancement with grain boundaries highlighted 
    Automatic object discrimination

    Image segmentation enables the AI, with minimal training, to identify and count different object types in your sample.

    Image (left) : Through holes in PCB
    Image (right) : Live detection of filled through holes and empty through holes in PCB

    Observation Method

    BF: Brightfield

    DF: Darkfield

    DIC: Differential interference contrast

    POL: Polarized light

    OB: Oblique

    MIX: Mix Brightfield with Darkfield

    SF: Shaded Relief

    Specification are subject to change without notice or obligation on the part of the manufacturer