Laser Confocal Microscopes
OLS5100

3D profiler laser scanning confocal microscope 

Exceptional measurement accuracy and Optical performance
OLS5100 laser microscope combines exceptional measurement accuracy and optical performance with smart tools that make the microscope easy to use. Precisely measure shape and surface roughness at the submicron level quickly and efficiently to simplify your workflow with data you can trust.

Built for failure analysis and material engineering research, the OLS5100 laser microscope combines exceptional measurement accuracy and optical performance with smart tools that make the microscope easy to use. Precisely measure shape and surface roughness at the submicron level quickly and efficiently to simplify your workflow with data you can trust.
Easy Laser Scanning Microscopy

Using the microscope is easy for novice and experienced users thanks to thoughtfully designed software.

  • Acquire accurate data easily—put your sample on the stage and press the start button
  • Measurement performance guarantee tailored to your operating environment*.

The information, including guaranteed accuracy, on this web page is based on conditions set by Evident

Guaranteed Measurement Accuracy

LEXT microscope objectives deliver highly accurate measurement data. Paired with the Smart Lens Advisor, you can acquire accurate data you can be confident in.

  • Guaranteed measurement accuracy
  • 10x to 100x objectives that reduce aberrations at 405 nm to capture the correct shape of your sample throughout the entire field of view
  • Smart Lens Advisor helps you choose the right objective lens for your roughness measurement


    User-Friendly, High-Precision, 3-Axis Measurement

    Continuous auto focus

    The microscope’s continuous autofocus keeps your images in focus when moving the stage or changing objectives, minimizing the need for manual adjustments. Permanent focus tracking enables you to perform observations quickly and easily.

    Dual DIC for nano-scale, real-time observation

    Detect minute damage in your sample with real-time, nanometerscale observation. Differential interference contrast (DIC) observation enables you to visualize nanometer-scale surface contours that are normally beyond the resolving power of a laser microscope. With DIC laser mode, the OLS5100 microscope can obtain live images comparable to those of an electron microscope, even when using a 5x or 10x low-power objective.

    •Left Image: Back surface of wafer     •Right Image: Hard disk landing zone

    Suggested Models


    OLS-SAF
    Motorized Standard Stage

    100 mm x 100 mm

    OLS-LAF
    Motorized Large Stage

    300mm x 300mm

    OLS-SMF
    Manual Standard Stage

    100mm x 100mm

    OLS-EAF
    Extended Height Frame

    100mm x 100mm

    Custom
    Custom Version

    Contact us to find out more

    OLS-SAF
    Motorized Standard Stage

    100 mm x 100 mm

    OLS-LAF
    Motorized Large Stage

    300mm x 300mm

    OLS-SMF
    Manual Standard Stage

    100mm x 100mm

    OLS-EAF
    Extended Height Frame

    100mm x 100mm

    Custom
    Custom Version

    Contact us to find out more

    Laser Confocal Optics

    The laser confocal optical system receives only the light focused through the circular pinhole, rather than capturing all the light reflected and scattered from the sample. This helps eliminate blur, making it possible to acquire an image with higher contrast than can be obtained with an ordinary microscope.

    405 nm Laser Light Source

    A laser microscope using a short-wavelength laser has better lateral resolution than a traditional microscope using visible laser light (peak value 550 nm). The OLS5100 microscope’s 405 nm laser diode offers exceptional lateral resolution.

    Non-contact, nondestructive, and fast
    No sample preparation required—simply place the sample on the stage and you're ready to measure.
    Sub-micron 3D observation/measurement

    Observe steps in the nanometer range and measure height differences at the sub-micron level.

    ISO25178-compliant surface roughness measurement
    Measure surface roughness from linear to planar

     

    Model OLS5100-SAF OLS5100-SMF OLS5100-LAF OLS5100-EAF
    Total magnification

    54x–17,280x

    Field of view

    16 µm–5,120 µm

    Measurement principle Optical system Reflection-type confocal laser scanning laser microscope
    Reflection-type confocal laser scanning laser-DIC microscope
    Color
    Color-DIC
      Light receiving element Laser: Photomultiplier (2 channels)
    Color: CMOS color camera
    Height measurement Display resolution 0.5 nm
      Dynamic range 16 bits
      Repeatability σn-1*1 *2 *5 5X: 0.45 μm, 10X: 0.1 μm, 20X: 0.03 μm, 50X : 0.012 μm, 100X : 0.012 μm
      Accuracy *1 *3 *5 0.15+L/100 μm (L:Measuring length[μm])
      Accuracy for stitched image *1 *3 *5 10X: 5.0+L/100 μm, 20X or higher: 1.0+L/100 μm (L: Stitching length [μm])
      Measurement noise (Sq noise) *1 *4 *5 1 nm (Type)
    Width measurement Display resolution 1 nm
      Repeatability 3σn-1  *1 *2 *5 

    5X: 0.4 μm, 10X: 0.2 μm, 20X: 0.05 μm, 50X: 0.04 μm, 100X: 0.02 μm

      Accuracy *1 *3 *5 Measurement value +/- 1.5%
      Accuracy for stitched image *1 *3 *5 10X: 24+0.5L μm, 20X: 15+0.5L μm, 50X: 9+0.5L μm, 100X: 7+0.5L μm (L: Stitching length [mm])
    Maximum number of measuring points in a single measurement

    4096 × 4096 pixels

    Maximum number of measuring points

    36-megapixels

    XY stage configuration Length measurement module NA NA
      Operating range

    100 × 100 mm (3.9 × 3.9 in.) Motorized

    100 × 100 mm (3.9 × 3.9 in.) Manual

    300 × 300 mm (11.8 × 11.8 in.) Motorized

    100 × 100 mm (3.9 × 3.9 in.) Motorized

    Maximum sample height

    100 mm (3.9 × 3.9 in.)

    40 mm (1.6 in.)

    37 mm (1.5 in.)

    210 mm (8.3 in.)

    Laser light source Wavelength 405 nm
      Maximum output 0.95 mW
      Laser class Class 2 (IEC60825-1:2007, IEC60825-1:2014)*6
    Color light source White LED
    Electrical power 240 W 240 W 278 W 240 W
    Mass Microscope body Approx. 31 kg (68.3 lb) Approx. 32 kg (70.5 lb) Approx. 50 kg (110.2 lb) Approx. 43 kg (94.8 lb)
      Control box Approx. 12 kg (26.5 lb)

    *1 Guaranteed when used in constant temperature and constant-humidity environment (temperature: 20˚C±1˚C, humidity: 50%±10%) specified in ISO554(1976), JIS Z-8703(1983).
    *2 For 20x or higher, when measured with MPLAPON LEXT series objectives.
    *3 When measured with dedicated LEXT objective.
    *4 Typical value when measured with MPLAPON100XLEXT objective, and may differ from the guaranteed value.
    *5 Guaranteed under Evident Certificate System.
    *6 OLS5100 is a Class 2 laser product. Do not stare into beam.

    ** The OS license of Window 10 has been certified for the microscope controller provided by Evident. Therefore, Microsoft's license terms are applied and you agree to the terms.Please refer to the following for Microsoft license terms.
    https://www.microsoft.com/en-us/Useterms/Retail/Windows/10/UseTerms_Retail_Windows_10_english.htm

    Series Model Numerical Aperture (NA) Working Distance (WD) (mm)
    UIS2 objective lens MPLFLN2.5X 0.08 10.7
    MPLFLN5X 0.15 20
    Dedicated LEXT objective lens (10X) MPLFLN10XLEXT 0.3 10.4
    Dedicated LEXT objective lens (high-performance type) MPLAPON20XLEXT 0.6 1
    MPLAPON50XLEXT 0.95 0.35
    MPLAPON100XLEXT 0.95 0.35
    Dedicated LEXT objective lens (long working distance type) LMPLFLN20XLEXT 0.45 6.5
    LMPLFLN50XLEXT 0.6 5.2
    LMPLFLN100XLEXT 0.8 3.4
    Super long working distance lens SLMPLN20X 0.25 25
    SLMPLN50X 0.35 18
    SLMPLN100X 0.6 7.6
    Long working distance for LCD lens LCPLFLN20XLCD 0.45 8.3-7.4
    LCPLFLN50XLCD 0.7 3.0-2.2
    LCPLFLN100XLCD 0.85 1.2-0.9

     

    Specification are subject to change without notice or obligation on the part of the manufacturer