Semiconductor Inspection Microscopes

300mm Wafer / FPD Inspection Microscope MX61L
300mm Wafer / FPD Inspection Microscope
MX63L
Advanced basic optical performance and diverse observation modes reaching the highest efficiency in observation and inspection
- 300mm wafer/FPD inspection microscope
Semiconductor Inspection Microscope MX63
Semiconductor Inspection Microscope
MX63
Advanced basic optical performance and diverse observation modes reaching the highest efficiency in observation and inspection
- 200mm wafer inspection microscope